Description:
Bellingham, WA: SPIE Optical Engineering Press, 1995. Hardcover, [xiii], 321 pages. Near Fine condition. Second edition. Size 10.25"x7.25". "As the authoritative resource on optical scattering, this book was developed from many years of teaching light-scatter measurement and analysis courses to optical engineers. Dr. Stover covers scattering beginning with its basics and covering surface roughness calculations, measurements, instrumentation, predictions, specifications, and industrial applications. Also included are appendices that review the basics of wave propagation and Kirchhoff diffraction. Whether you're an optical engineer currently investigating roughness-induced haze in the semiconductor industry, or just entering the field of scatter metrology, this text will be invaluable." Book has very light exterior shelfwear, else As New, clean and unmarked.. Near Fine.
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Optical Scattering: Measurement and Analysis Hardcover - 1995
by John C. Stover
Details
- Title Optical Scattering: Measurement and Analysis
- Author John C. Stover
- Binding Hardcover
- Edition Second
- Pages 340
- Volumes 1
- Language ENG
- Publisher SPIE-International Society for Optical Engine
- Date 1995-07
- ISBN 9780819419347 / 0819419346
- Weight 1.78 lbs (0.81 kg)
- Dimensions 10.31 x 7.34 x 0.94 in (26.19 x 18.64 x 2.39 cm)
- Library of Congress Catalog Number 95014620
- Dewey Decimal Code 535.4
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Optical Scattering: Measurement and Analysis (Second Edition)
by Stover, John C.
- Used
- near fine
- Hardcover
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- Used - Near Fine
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- Hardcover
- ISBN 10 / ISBN 13
- 9780819419347 / 0819419346
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Optical Scattering Vol. 24 : Measurement and Analysis
by John C. Stover
- Used
- very good
- Hardcover
- Condition
- Used - Very Good
- Binding
- Hardcover
- ISBN 10 / ISBN 13
- 9780819419347 / 0819419346
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- 2
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Seattle, Washington, United States
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Description:
SPIE, 1995. Hardcover. Very Good. Disclaimer:May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.Dust jacket quality is not guaranteed.
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Optical Scattering: Measurement and Analysis
by Stover, John C.
- Used
- Hardcover
- Condition
- Used - Good+
- Binding
- Hardcover
- ISBN 10 / ISBN 13
- 9780819419347 / 0819419346
- Quantity Available
- 1
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Datil, New Mexico, United States
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£29.04£3.99 shipping to USA
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Description:
Bellingham, WA: SPIE Optical Engineering Press, 1995. Hardcover, [xiii], 321 pages. Good+ condition. Second edition. Size 10.25"x7.25". "Dr. Stover covers scattering beginning with its basics and covering surface roughness calculations, measurements, instrumentation, predictions, specifications, and industrial applications. Also included are appendices that review the basics of wave propagation and Kirchhoff diffraction. Whether you're an optical engineer currently investigating roughness-induced haze in the semiconductor industry, or just entering the field of scatter metrology, this text will be invaluable." Book has moderate exterior shelfwear, and a small surface tear on the front board cover. Previous owner's name on front fly, text else clean and unmarked.. Good+.
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Optical Scattering: Measurement and Analysis (SPIE Press Monograph Vol. PM24) (Press Monographs)
by John C. Stover
- Used
- good
- Hardcover
- Condition
- Used - Good
- Binding
- Hardcover
- ISBN 10 / ISBN 13
- 9780819419347 / 0819419346
- Quantity Available
- 1
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HOUSTON, Texas, United States
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£33.76FREE shipping to USA
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SPIE Publications, 1995-07-01. Hardcover. Good.
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