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Electronic Thin-Film Reliability
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Electronic Thin-Film Reliability Hardcover - 2010 - 1st Edition

by King-Ning Tu


From the publisher

Thin films are widely used in the electronic device industry. As the trend for miniaturization of electronic devices moves into the nanoscale domain, the reliability of thin films becomes an increasing concern. Building on the author's previous book, Electronic Thin Film Science by Tu, Mayer and Feldman, and based on a graduate course at UCLA given by the author, this new book focuses on reliability science and the processing of thin films. Early chapters address fundamental topics in thin film processes and reliability, including deposition, surface energy and atomic diffusion, before moving onto systematically explain irreversible processes in interconnect and packaging technologies. Describing electromigration, thermomigration and stress migration, with a closing chapter dedicated to failure analysis, the reader will come away with a complete theoretical and practical understanding of electronic thin film reliability. Kept mathematically simple, with real-world examples, this book is ideal for graduate students, researchers and practitioners.

Details

  • Title Electronic Thin-Film Reliability
  • Author King-Ning Tu
  • Binding Hardcover
  • Edition number 1st
  • Edition 1
  • Pages 412
  • Volumes 1
  • Language ENG
  • Publisher Cambridge University Press
  • Date 2010-11-25
  • ISBN 9780521516136 / 0521516137
  • Weight 2.11 lbs (0.96 kg)
  • Dimensions 9.8 x 6.9 x 0.9 in (24.89 x 17.53 x 2.29 cm)
  • Library of Congress subjects Reliability (Engineering), Thin films
  • Library of Congress Catalog Number 2010033855
  • Dewey Decimal Code 621.381
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Electronic Thin-Film Reliability
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Electronic Thin-Film Reliability

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Electronic Thin Film Reliability
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Electronic Thin Film Reliability

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Electronic Thin-Film Reliability

Electronic Thin-Film Reliability

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Hardback. New. Based on a graduate course at UCLA, this book describes reliability and failure of thin films. Beginning with core topics such as deposition and diffusion, the book fully explains irreversible processes with practical examples. Closing with failure analysis, this book is ideal for graduate students, researchers and practitioners.
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Electronic Thin-Film Reliability
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Electronic Thin-Film Reliability

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