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AT&T Reliability Manual Hardcover - 1999 - 1989th Edition
by David J. Klinger; Yoshinao Nakada; Maria A. Menendez
Partial Contents: Reliability Concepts; Device Reliability; Hazard Rates; Monitoring Reliability; Specific Device Information, and more. Appendixes. 60 illustrations.
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- Title AT&T Reliability Manual
- Author David J. Klinger; Yoshinao Nakada; Maria A. Menendez
- Binding Hardcover
- Edition number 1989th
- Edition 1989
- Pages 226
- Volumes 1
- Language ENG
- Publisher Springer, New York
- Date 1999-02-03
- ISBN 9780442318482 / 0442318480
- Weight 1.34 lbs (0.61 kg)
- Dimensions 10.38 x 7.32 x 0.69 in (26.37 x 18.59 x 1.75 cm)
- Library of Congress subjects Telecommunication - Equipment and supplies -
- Library of Congress Catalog Number 89-24887
- Dewey Decimal Code 621.382
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AT&T Reliability Manual
by Klinger, David J.; Nakada, Yoshinao; Menendez, Maria A.
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Springer, 1999. Hardcover. Good. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.Dust jacket quality is not guaranteed.
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AT&T Reliability Manual
by David J. Klinger; Yoshinao Nakada; Maria A. Menendez
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New York: Van Nostrand Reinhold Company, 1990. Hardcover. As New/As New. Gilt lettering on blue covers in a blue pictorial dust jacket. 4to, 226pp.
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At&t Reliability Manual
by Editor-David J. Klinger; Editor-Yoshinao Nakada; Editor-Maria A. Menendez
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At&t Reliability Manual
by David J. Klinger [Editor]; Yoshinao Nakada [Editor]; Maria A. Menendez [Editor];
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Springer, 1999-02-03. Hardcover. New. New. In shrink wrap. Looks like an interesting title!
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At&t Reliability Manual
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At&t Reliability Manual
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Hardback. New. Partial Contents: Reliability Concepts; Device Reliability; Hazard Rates; Monitoring Reliability; Specific Device Information, and more. Appendixes. 60 illustrations.
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At&t Reliability Manual
by David J. Klinger [Editor]; Yoshinao Nakada [Editor]; Maria A. Menendez [Editor];
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AT&T Reliability Manual
by Klinger, David J., Nakada, Yoshinao & Menendez, Maria A
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New York: Van Nostrand Reinhold, 1990. Comprehensive text provides electronics systems engineers concepts, measures, methods, and latest component reliability data based on more than 30 years of performance trials. Includes the first complete elucidation of AT&T's reliability model- the detailed table of component hazard rates from actual field data; system evaluation and performance monitoring; device assessment; physical and methematical derivations; etc. 223 pgs. Illustrated. Prior owner's name on front endpaper. Dustjacket in mylar.. First Edition. Hard Cover. Fine/Fine. 4to - over 9¾" - 12" tall.
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