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Advances in X-Ray Analysis
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Advances in X-Ray Analysis Hardcover - 1993

by Gilfrich; C. R. Hubbard (Editor); J. V. Gilfrich (Editor)


From the publisher

Mathematical Techniques in XRay Spectrometry: Research in the Quantitative Analysis of Individual Particles by XRay Fluorescence Spectrometry (M. Lankosz et al.). Analysis of Light Elements by XRay Spectrometry: XRFA of Carbon in Steels (F. Weber et al.). XRS Techniques and Instrumentation: Diffraction Peaks in XRay Spectroscopy (R.G.Tissot, R.P. Goehner). OnLine, Industrial, and Other Applications of XRS: Application of XRF in the Aluminum Industry (F.R. Feret). XRay Characterization of Thin Films: Grazing Incidence XRay Characterization of Materials (D.K. Bowen, M. Wormington). WholePattern Fitting, Phase Analysis by Diffraction Methods: Phase Identification Using WholePattern Matching (D.K. Smith et al.). Polymer Applications of XRD. HighTemperature and NonAmbient Applications of XRD. Stress and Strain Determination by Diffraction Methods, Peak Broadening Analysis. XRD Techniques and Instrumentation. 71 additional articles. Index.

Details

  • Title Advances in X-Ray Analysis
  • Author Gilfrich; C. R. Hubbard (Editor); J. V. Gilfrich (Editor)
  • Binding Hardcover
  • Edition 2nd
  • Pages 712
  • Volumes 1
  • Language ENG
  • Publisher Kluwer Academic Publishers, New York, New York, U.S.A.
  • Date 1993-08-01
  • Illustrated Yes
  • ISBN 9780306445712 / 0306445719
  • Weight 3.17 lbs (1.44 kg)
  • Dimensions 10 x 7 x 1.5 in (25.40 x 17.78 x 3.81 cm)
  • Library of Congress Catalog Number 58-35928
  • Dewey Decimal Code 543.085
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Advances in X-Ray Analysis
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Advances in X-Ray Analysis, Vol. 36

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Advances in X-Ray Analysis, Vol. 36
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