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Test Generation for VLSI Chips
by Agrawal, Vishwani; Seth, Sharad C
- Used
- Very Good
- Hardcover
- Condition
- Very Good
- ISBN 10
- 081868786X
- ISBN 13
- 9780818687860
- Seller
-
Vancouver, Washington, United States
Payment Methods Accepted
About This Item
Computer Society Press, 1988. hardcover in very good + condition.. Hardcover. Very Good.
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Details
- Bookseller
- Rob Briggs Books (US)
- Bookseller's Inventory #
- 600383
- Title
- Test Generation for VLSI Chips
- Author
- Agrawal, Vishwani; Seth, Sharad C
- Format/Binding
- Hardcover
- Book Condition
- Used - Very Good
- Quantity Available
- 1
- ISBN 10
- 081868786X
- ISBN 13
- 9780818687860
- Publisher
- Computer Society Press
- Date Published
- 1988
- Keywords
- INTEGRATED CIRCUITS_VERY LARGE SCALE INTEGRATION
- Bookseller catalogs
- Computers;
Terms of Sale
Rob Briggs Books
If book is not described correctly you may return it within 3 weeks of purchase.
About the Seller
Rob Briggs Books
Biblio member since 2005
Vancouver, Washington
About Rob Briggs Books
We specialize in non-fiction technical books and college textbooks.