Frontiers Of Characterization And Metrology For Nanoelectronics
by Editor-David G. Seiler; Editor-Alain C. Diebold; Editor-Robert McDonald; Editor-C. Michael Garner; Editor-Dan Herr; Editor-Rajinder P. Khosla; Editor-Erik M. Secula
- Used
- Hardcover
- Condition
- Fine, sealed CD, two small bumps bottom of front cover, text unmarked
- ISBN 10
- 0735404410
- ISBN 13
- 9780735404410
- Seller
-
Baltimore, Maryland, United States
Payment Methods Accepted
About This Item
Large hardback with 578 pages and sealed CD. FINE
Reviews
(Log in or Create an Account first!)
Details
- Bookseller
- Arbutus Books (US)
- Bookseller's Inventory #
- 873
- Title
- Frontiers Of Characterization And Metrology For Nanoelectronics
- Author
- Editor-David G. Seiler; Editor-Alain C. Diebold; Editor-Robert McDonald; Editor-C. Michael Garner; Editor-Dan Herr; Editor-Rajinder P. Khosla; Editor-Erik M. Secula
- Book Condition
- Used - Fine, sealed CD, two small bumps bottom of front cover, text unmarked
- Quantity Available
- 1
- Binding
- Hardcover
- ISBN 10
- 0735404410
- ISBN 13
- 9780735404410
- Publisher
- American Institute of Physics
- Date Published
- 2007
Terms of Sale
Arbutus Books
30 day return guarantee, with full refund including original shipping costs for up to 30 days after delivery if an item arrives misdescribed or damaged.
About the Seller
Arbutus Books
Biblio member since 2013
Baltimore, Maryland
About Arbutus Books
Retired person selling from home. Selling a small number of books in the $50 - $200 range for a local charity
Glossary
Some terminology that may be used in this description includes:
- Fine
- A book in fine condition exhibits no flaws. A fine condition book closely approaches As New condition, but may lack the...