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Scanning Probe Microscopy in Nanoscience and Nanotechnology Hardcover - 2010
by Bharat Bhushan (Editor)
From the rear cover
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective. With a foreword by the co-inventor of AFM, Christoph Gerber
Details
- Title Scanning Probe Microscopy in Nanoscience and Nanotechnology
- Author Bharat Bhushan (Editor)
- Binding Hardcover
- Edition 1st
- Pages 956
- Volumes 1
- Language ENG
- Publisher Springer
- Date 2010-03-05
- Illustrated Yes
- Features Bibliography, Illustrated, Index, Table of Contents
- ISBN 9783642035340 / 3642035345
- Weight 3.25 lbs (1.47 kg)
- Dimensions 9.5 x 6.3 x 1.7 in (24.13 x 16.00 x 4.32 cm)
- Dewey Decimal Code 530.411
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Scanning Probe Microscopy in Nanoscience and Nanotechnology
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Scanning Probe Microscopy In Nanoscience And Nanotechnology (Nanoscience And Technology)
by Bhushan Bharat
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