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1998 International Conference on Indium Phosphide & Related Materials Paperback - 1998

by IEEE Electron Devices Society; IEEE Lasers & Electro-Optics Society; Institute of Electrical & Electronics En (Editor)


From the publisher

This text examines test structures for microelectronic devices, their recent progress and future directions. It places an emphasis on such topics as: process characterization; dimensional measurements; interconnection; material characterization; reliability; device characterization; and statistics.

Details

  • Title 1998 International Conference on Indium Phosphide & Related Materials
  • Author IEEE Electron Devices Society; IEEE Lasers & Electro-Optics Society; Institute of Electrical & Electronics En (Editor)
  • Binding Paperback
  • Pages 800
  • Volumes 1
  • Language ENG
  • Publisher Institute of Electrical & Electronics Enginee, Piscataway, New Jersey
  • Date January 1998
  • ISBN 9780780342200 / 0780342208
  • Dewey Decimal Code 621