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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition Hardcover - 2003

by Joseph Goldstein; Dale E. Newbury; David C. Joy

This text provides students as well as practitioners (engineers, technicians, physical and biological scientists, clinicians, and technical managers) with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis.


From the publisher

An ideal text for students as well as practitioners, this is a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The text has been used in educating over 3,000 students at the Lehigh SEM short course as well as thousands of undergraduate and graduate students at universities across the globe. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens.

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  • Title Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
  • Author Joseph Goldstein; Dale E. Newbury; David C. Joy
  • Binding Hardcover
  • Edition 3rd
  • Pages 689
  • Volumes 1
  • Language ENG
  • Publisher Springer, USA
  • Date February 2003
  • Illustrated Yes
  • Features Bibliography, Illustrated, Index, Maps
  • ISBN 9780306472923 / 0306472929
  • Weight 3.65 lbs (1.66 kg)
  • Dimensions 9.9 x 7.3 x 1.4 in (25.15 x 18.54 x 3.56 cm)
  • Library of Congress subjects Scanning electron microscopy, X-ray microanalysis
  • Library of Congress Catalog Number 2002028276
  • Dewey Decimal Code 502.825
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Scanning Electron Microscopy and X-Ray Microanalysis
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Scanning Electron Microscopy and X-Ray Microanalysis

by Lifshin, Eric, Echlin, Patrick, Goldstein, Joseph, Joy, David C., Lyman, Charles E

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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition

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Scanning Electron Microscopy and X-Ray Microanalysis Third Edition

Scanning Electron Microscopy and X-Ray Microanalysis Third Edition

by Joseph Goldstein And Dale E. Newbury And David C. Joy And Charles E. Lyman And Patrick Echlin And Eric Lifshin And Linda Sawyer And J. R. Michael

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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition

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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition

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Scanning Electron Microscopy and X-Ray Microanalysis

by Linda Sawyer David C. Joy J.R. Michael Linda C. Sawyer Eric Lifshin Patrick Echlin Charles E. Lyman D.C. Joy Dale E. Newbury Joseph Goldstein

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