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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition Hardcover - 2003
by Joseph Goldstein; Dale E. Newbury; David C. Joy
This text provides students as well as practitioners (engineers, technicians, physical and biological scientists, clinicians, and technical managers) with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis.
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- Title Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
- Author Joseph Goldstein; Dale E. Newbury; David C. Joy
- Binding Hardcover
- Edition 3rd
- Pages 689
- Volumes 1
- Language ENG
- Publisher Springer, USA
- Date February 2003
- Illustrated Yes
- Features Bibliography, Illustrated, Index, Maps
- ISBN 9780306472923 / 0306472929
- Weight 3.65 lbs (1.66 kg)
- Dimensions 9.9 x 7.3 x 1.4 in (25.15 x 18.54 x 3.56 cm)
- Library of Congress subjects Scanning electron microscopy, X-ray microanalysis
- Library of Congress Catalog Number 2002028276
- Dewey Decimal Code 502.825
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Scanning Electron Microscopy and X-Ray Microanalysis
by Lifshin, Eric, Echlin, Patrick, Goldstein, Joseph, Joy, David C., Lyman, Charles E
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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
by Goldstein, Joseph
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Scanning Electron Microscopy and X-Ray Microanalysis Third Edition
by Joseph Goldstein And Dale E. Newbury And David C. Joy And Charles E. Lyman And Patrick Echlin And Eric Lifshin And Linda Sawyer And J. R. Michael
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USA: Springer. Fair with No dust jacket as issued. 2003. Third Edition; First Printing. Hardcover. 0306472929 . Stains to exterior edge of pages. Highlighting and notes. Otherwise in good condition.; 689 pages .
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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
by Goldstein, Joseph; Newbury, Dale E.; Joy, David C.; Lyman, Charles E.; Echlin, Patrick; Lifshin, Eric; Sawyer, Linda; Michael, J.R
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Springer, 2007-04-30. Hardcover. Good. US Edition Textbook, May Have Highlights, Notes and/or Underlining, BOOK ONLY-NO ACCESS CODE, NO CD, Ships with Emailed Tracking from USA
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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
by Goldstein, Joseph; Newbury, Dale E.; Joy, David C.; Lyman, Charles E.; Echlin, Patrick; Lifshin, Eric; Sawyer, Linda; Michael, J.R
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Springer, 2003-01-31. Hardcover. New. New. In shrink wrap. Looks like an interesting title!
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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
by Goldstein, Joseph
- Used
- Hardcover
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- Used:Good
- Edition
- 3rd
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- Hardcover
- ISBN 10 / ISBN 13
- 9780306472923 / 0306472929
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Springer, 2003-01-31. 3rd. hardcover. Used:Good.
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Scanning Electron Microscopy and X-Ray Microanalysis
by Linda Sawyer David C. Joy J.R. Michael Linda C. Sawyer Eric Lifshin Patrick Echlin Charles E. Lyman D.C. Joy Dale E. Newbury Joseph Goldstein
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Springer , pp. xix + 689 3rd Edition . Hardback. New.
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