Description:
NEW YORK: Academic Press, 1978. Hardcover. Very Good Plus / Very Good Plus. Designed as a self-contained reference work, the book sets down basic concepts and properties to develop theory and techniques for solving practical measurement problems in industry, "including such areas as surface roughness evaluation, displacement and strain movement, and vibration and deformation analysis." 331 pp. Some light soiling to board surfaces, previous owner's name blacked out to top and bottom edges and FFEP, DJ has very tiniest bit of edgewear and some light creasing to front flap and very light soiling to panel surfaces. Book has gilt lettering to front board and spine, is tight, bright, and clean.
Stock Photo: Cover May Be Different
Details
- Title Speckle Metrology
- Author Robert K. Erf (Other)
- Binding Paperback
- Pages 1
- Volumes 1
- Language ENG
- Publisher Academic Press, NEW YORK
- Date 1978
- ISBN 9780122413605 / 0122413601
- Library of Congress subjects Speckle metrology
- Library of Congress Catalog Number 78000206
- Dewey Decimal Code 621.36
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Stock Photo: Cover May Be Different
SPECKLE METROLOGY (QUANTUM ELECTRONICS - PRINCIPLES AND APPLICATIONS)
by Erf, Robert K.
- Used
- Hardcover
- Condition
- Used - Very Good Plus / Very Good Plus
- Binding
- Hardcover
- ISBN 10 / ISBN 13
- 9780122413605 / 0122413601
- Quantity Available
- 1
- Seller
-
Creswell, Oregon, United States
- Item Price
-
£36.84£4.77 shipping to USA
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£36.84
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