Skip to content

VLSI Test Principles and Architectures: Design for Testability
Stock Photo: Cover May Be Different

VLSI Test Principles and Architectures: Design for Testability Hardcover - 2006

by Laung-Terng Wang; Cheng-Wen Wu; Xiaoqing Wen


From the publisher

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

Details

  • Title VLSI Test Principles and Architectures: Design for Testability
  • Author Laung-Terng Wang; Cheng-Wen Wu; Xiaoqing Wen
  • Binding Hardcover
  • Edition INTERNATIONAL ED
  • Pages 808
  • Volumes 1
  • Language ENG
  • Publisher Morgan Kaufmann Publishers, U.S.A.
  • Date July 7, 2006
  • ISBN 9780123705976 / 0123705975
  • Weight 3.92 lbs (1.78 kg)
  • Dimensions 9.38 x 8.12 x 2.06 in (23.83 x 20.62 x 5.23 cm)
  • Library of Congress subjects Integrated circuits - Very large scale, Integrated circuits - Very large scale
  • Library of Congress Catalog Number 2006006869
  • Dewey Decimal Code 621.395
Back to Top

More Copies for Sale

VLSI Test Principles and Architectures : Design for Testability
Stock Photo: Cover May Be Different

VLSI Test Principles and Architectures : Design for Testability

by Cheng-Wen Wu; Xiaoqing Wen; Laung-Terng Wang

  • Used
  • good
  • Hardcover
Condition
Used - Good
Binding
Hardcover
ISBN 10 / ISBN 13
9780123705976 / 0123705975
Quantity Available
1
Seller
Seattle, Washington, United States
Seller rating:
This seller has earned a 4 of 5 Stars rating from Biblio customers.
Item Price
£31.81
FREE shipping to USA

Show Details

Description:
Elsevier Science & Technology, 2006. Hardcover. Good. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.Dust jacket quality is not guaranteed.
Item Price
£31.81
FREE shipping to USA
VLSI Test Principles And Architectures: Design for Testability
Stock Photo: Cover May Be Different

VLSI Test Principles And Architectures: Design for Testability

by Wang, Laung-terng (Editor)/ Wu, Cheng-Wen (Editor)/ Wen, Xiaoqing (Editor)

  • New
  • Hardcover
Condition
New
Binding
Hardcover
ISBN 10 / ISBN 13
9780123705976 / 0123705975
Quantity Available
1
Seller
Exeter, Devon, United Kingdom
Seller rating:
This seller has earned a 3 of 5 Stars rating from Biblio customers.
Item Price
£67.51
£10.00 shipping to USA

Show Details

Description:
Morgan Kaufmann Pub, 2006. Hardcover. New. 1st edition. 777 pages. 9.25x7.50x2.00 inches.
Item Price
£67.51
£10.00 shipping to USA
VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems...
Stock Photo: Cover May Be Different

VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))

by Wang, Laung-Terng; Wu, Cheng-Wen; Wen, Xiaoqing; Abdel-Hafez, Khader S. [Contributor]; Bhattacharya, Soumendu [Contributor]; Chatterjee, Abhijit [Contributor]; Chen, Xinghao [Contributor]; Cheng, Kwang-Ting (Tim) [Contributor]; Eklow, William [Contributor

  • New
  • Hardcover
Condition
New
Binding
Hardcover
ISBN 10 / ISBN 13
9780123705976 / 0123705975
Quantity Available
1
Seller
San Diego, California, United States
Seller rating:
This seller has earned a 5 of 5 Stars rating from Biblio customers.
Item Price
£84.92
£4.41 shipping to USA

Show Details

Description:
Morgan Kaufmann. hardcover. New. New. In shrink wrap. Looks like an interesting title!
Item Price
£84.92
£4.41 shipping to USA
VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems...
Stock Photo: Cover May Be Different

VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))

by Wang, Laung-Terng; Wu, Cheng-Wen; Wen, Xiaoqing; Abdel-Hafez, Khader S. [Contributor]; Bhattacharya, Soumendu [Contributor]; Chatterjee, Abhijit [Contributor]; Chen, Xinghao [Contributor]; Cheng, Kwang-Ting (Tim) [Contributor]; Eklow, William [Contributor

  • Used
  • good
  • Hardcover
Condition
Used - Good
Binding
Hardcover
ISBN 10 / ISBN 13
9780123705976 / 0123705975
Quantity Available
2
Seller
Franklin Lakes, New Jersey, United States
Seller rating:
This seller has earned a 5 of 5 Stars rating from Biblio customers.
Item Price
£91.62
£3.16 shipping to USA

Show Details

Description:
Morgan Kaufmann, 2006-07-21. Hardcover. Good. Textbook, May Have Highlights, Notes and/or Underlining, BOOK ONLYNO ACCESS CODE, NO CD, Ships with Emailed Tracking
Item Price
£91.62
£3.16 shipping to USA