Home Single Electron Spin Measurements in Submicron Si MOS-FETs: Random Telegraph Signal, Single Electron Spin Resonance by Ming Xiao - 2008-12-18

Single Electron Spin Measurements in Submicron Si MOS-FETs: Random Telegraph Signal, Single Electron Spin Resonance by Ming Xiao - 2008-12-18

Name: Single Electron Spin Measurements in Submicron Si MOS-FETs Random Telegraph Signal, Single Electron Spin Resonance
Price: 55.95 GBP
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Author: Ming Xiao
ISBN: 9783836493758

by Ming Xiao

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Single Electron Spin Measurements in Submicron Si MOS-FETs: Random Telegraph Signal, Single Electron Spin Resonance

by Ming Xiao

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Paperback

VDM Verlag Dr. Müller, 2008-12-18. Paperback. Used:Good.

Bookseller Ergodebooks (US)
Format/Binding Paperback
Book Condition Used:Good
Quantity Available 1
Binding Paperback
ISBN 10 3836493756
ISBN 13 9783836493758
Publisher VDM Verlag Dr. Müller
Date Published 2008-12-18

We have 3 copies available starting at £55.95.

Stock Photo: Cover May Be Different

Single Electron Spin Measurements in Submicron Si MOS-FETs Random Telegraph Signal, Single Electron Spin Resonance

by Ming Xiao

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ISBN 10 / ISBN 13

9783836493758 / 3836493756

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759

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New. New Book; Fast Shipping from UK; Not signed; Not First Edition; The Single Electron Spin Measurements in Submicron Si MOS-FETs Random Telegraph Signal, Single Electron Spin Resonance.