Description:
NY: Plenum Press, 1995. Hardcover, [xviii], 372 pages. Near Fine condition. Size 10"x6.75". "This volume brings together the papers presented at the Chuck Fiori Memorial Symposium, held at the Microbeam Analysis Society Meeting of 1993. Several themes are apparent in this rich and authoritative collection of papers, which have both a historical and an up-to-the-minute dimension." Book has very light exterior shelfwear, else Fine condition, clean and unmarked.. Near Fine.
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X-Ray Spectrometry in Electron Beam Instruments
by Williams, David B.; Goldstein, Joseph; Newbury, Dale E. (Editors)
- Used
- near fine
- Hardcover
- Condition
- Used - Near Fine
- Binding
- Hardcover
- ISBN 13
- 9780306448584
- ISBN 10
- 0306448580
- Quantity Available
- 1
- Seller
-
Datil, New Mexico, United States
- Item Price
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£30.07£4.03 shipping to USA
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Item Price
£30.07
£4.03
shipping to USA
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