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X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures
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X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures Hardcover - 2004 - 2004th Edition

by Martin Schmidbauer


From the publisher

This monograph represents a critical survey of the outstanding capabilities of X-ray
diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments.

Details

  • Title X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures
  • Author Martin Schmidbauer
  • Binding Hardcover
  • Edition number 2004th
  • Edition 2004
  • Pages 204
  • Volumes 1
  • Language ENG
  • Publisher Springer, Secaucus, New Jersey, U.S.A.
  • Date 2004-01-09
  • Illustrated Yes
  • ISBN 9783540201793 / 3540201793
  • Weight 1.15 lbs (0.52 kg)
  • Dimensions 9.4 x 6.3 x 0.7 in (23.88 x 16.00 x 1.78 cm)
  • Library of Congress subjects Semiconductors - Surfaces, Self-organizing systems
  • Library of Congress Catalog Number 2003064262
  • Dewey Decimal Code 539.722
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X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures
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X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures

by Martin Schidbauer

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New York: Springer, 2004. Hardcover. Very Good/No dustjacket, as published. 8vo. pp. 214, as new, still in shrink wrap. ""This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems…
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X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures
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X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures

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X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures
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X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures

by Martin Schmidbauer

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X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures (Springer Tracts...
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X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures (Springer Tracts in Modern Physics, 199)

by Schmidbauer, Martin

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