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Applied Scanning Probe Methods I
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Applied Scanning Probe Methods I Hardcover - 2004 - 2004th Edition

by Bharat Bhushan (Editor); Harald Fuchs (Editor); Sumio Hosaka (Editor)


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Examining the physical and technical foundation for recent progress with this technique, Applied Scanning Probe Methods offers a timely and comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. First it lays the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM.

Details

  • Title Applied Scanning Probe Methods I
  • Author Bharat Bhushan (Editor); Harald Fuchs (Editor); Sumio Hosaka (Editor)
  • Binding Hardcover
  • Edition number 2004th
  • Edition 2004
  • Pages 476
  • Volumes 1
  • Language ENG
  • Publisher Springer
  • Date 2004-01-13
  • Illustrated Yes
  • ISBN 9783540005278 / 3540005277
  • Weight 1.92 lbs (0.87 kg)
  • Dimensions 9.21 x 6.14 x 1.06 in (23.39 x 15.60 x 2.69 cm)
  • Library of Congress Catalog Number 2003059049
  • Dewey Decimal Code 502.82
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Applied Scanning Probe Methods
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Applied Scanning Probe Methods

by B. Bhushan,H. Fuchs,S. Hosaka

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Springer, 2004. Hardcover. Very Good/No dustjacket as published. 8vo. pp. 496, ""Examining the physical and technical foundation for recent progress with this technique, Applied Scanning Probe Methods offers a timely and comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. First it lays the theoretical background of…
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APPLIED SCANNING PROBE METHODS I
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APPLIED SCANNING PROBE METHODS I

by BHUSHAN, BHARAT; FUCHS, HARALD; HOSAKA, SUMIO ,

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Applied Scanning Probe Methods I
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Applied Scanning Probe Methods I

by S. Hosaka H. Fuchs B. Bhushan

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Applied Scanning Probe Methods I (NanoScience and Technology)
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Applied Scanning Probe Methods I (NanoScience and Technology)

by Bhushan, Bharat [Editor]; Fuchs, Harald [Editor]; Hosaka, Sumio [Editor];

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