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Stress-Induced Phenomena in Metallization
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Stress-Induced Phenomena in Metallization Hardcover - 2002

by Shefford P. Baker (Editor); Matti A. Korhonen (Editor); Eduard Arzt (Editor)


From the publisher

Tiny metal structures, less than a millionth of a metre across, are critical building blocks in a number of high-tech devices such as computer chips. These metallizations are subjected to extreme conditions of temperature, electric current density and mechanical load, which may cause the device they are in to fail. This book contains research papers on these metallizations and on the reliability problems associated with them. The papers were peer reviewed for these proceedings.

Details

  • Title Stress-Induced Phenomena in Metallization
  • Author Shefford P. Baker (Editor); Matti A. Korhonen (Editor); Eduard Arzt (Editor)
  • Binding Hardcover
  • Edition U. S. EDITION
  • Pages 250
  • Volumes 1
  • Language ENG
  • Publisher American Institute of Physics
  • Date April 9, 2002
  • Illustrated Yes
  • Features Bibliography, Illustrated, Index, Table of Contents
  • ISBN 9780735400580 / 073540058X
  • Weight 1.3 lbs (0.59 kg)
  • Dimensions 9.5 x 6.6 x 0.8 in (24.13 x 16.76 x 2.03 cm)
  • Library of Congress subjects Integrated circuits - Defects, Thin film devices - Defects
  • Library of Congress Catalog Number 22102851
  • Dewey Decimal Code 621.381
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Stress Induced Phenomena in Metallization
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Stress Induced Phenomena in Metallization: Sixth International Workshop on Stress Induced...
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Stress Induced Phenomena in Metallization: Sixth International Workshop on Stress Induced Phenomena in Metallization, Ithaca, New York, 25-27 July ... Stress-Induced Phenomena Metallizat.)

by Editor-Shefford P. Baker; Editor-Matti A. Korhonen; Editor-Eduard Arzt; Editor-Paul S. Ho

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Stress Induced Phenomena in Metallization: Sixth International Workshop on Stress Induced Phenomena in Metallization, Ithaca, New York, 25-27 July ... Stress-Induced Phenomena Metallizat.)

by Shefford P. Baker (Editor), Matti A. Korhonen (Editor), Eduard Arzt (Editor), Paul S. Ho (Editor)

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