Description:
San Diego, California, U.S.A.: Academic Press, Inc., 1989. Cover and contents in very good clean condition. Mild age spotting to top of page block. Library stamp on FEP, title page and BEP. Black cover with gilt lettering to spine and upper board.. First Edition, First Printing. hardcover. Very Good/No Dust Jacket. Ex-Library.
Stock Photo: Cover May Be Different
Atom-Probe Field Ion Microscopy and Its Applications (Advances in Electronics & Electron Physics Supplement) Unknown - 1989
by Sakurai, Toshio
Details
- Title Atom-Probe Field Ion Microscopy and Its Applications (Advances in Electronics & Electron Physics Supplement)
- Author Sakurai, Toshio
- Binding unknown
- Edition First Edition, F
- Publisher Academic Pr, San Diego, California, U.S.A.
- Date 1989-02
- ISBN 9780120145829
More Copies for Sale
Stock Photo: Cover May Be Different
Atom-Probe Field Ion Microscopy and Its Applications (Advances in Electronics and Electron Physics. Supplement; 20)
by Sakurai, Toshio; Sakai, A.; Pickering, H.W.
- Used
- very good
- Hardcover
- first
- Condition
- Used - Very Good
- Edition
- First Edition, First Printing
- Binding
- Hardcover
- ISBN 10 / ISBN 13
- 9780120145829 / 0120145820
- Quantity Available
- 1
- Seller
-
Didcot, Oxfordshire, United Kingdom
- Item Price
-
£37.57£9.50 shipping to USA
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Item Price
£37.57
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