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Atom-Probe Field Ion Microscopy and Its Applications (Advances in Electronics &
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Atom-Probe Field Ion Microscopy and Its Applications (Advances in Electronics & Electron Physics Supplement) Unknown - 1989

by Sakurai, Toshio


Details

  • Title Atom-Probe Field Ion Microscopy and Its Applications (Advances in Electronics & Electron Physics Supplement)
  • Author Sakurai, Toshio
  • Binding unknown
  • Edition First Edition, F
  • Publisher Academic Pr, San Diego, California, U.S.A.
  • Date 1989-02
  • ISBN 9780120145829
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Atom-Probe Field Ion Microscopy and Its Applications (Advances in Electronics and Electron...
Stock Photo: Cover May Be Different

Atom-Probe Field Ion Microscopy and Its Applications (Advances in Electronics and Electron Physics. Supplement; 20)

by Sakurai, Toshio; Sakai, A.; Pickering, H.W.

  • Used
  • very good
  • Hardcover
  • first
Condition
Used - Very Good
Edition
First Edition, First Printing
Binding
Hardcover
ISBN 10 / ISBN 13
9780120145829 / 0120145820
Quantity Available
1
Seller
Didcot, Oxfordshire, United Kingdom
Seller rating:
This seller has earned a 5 of 5 Stars rating from Biblio customers.
Item Price
£37.57
£9.50 shipping to USA

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Description:
San Diego, California, U.S.A.: Academic Press, Inc., 1989. Cover and contents in very good clean condition. Mild age spotting to top of page block. Library stamp on FEP, title page and BEP. Black cover with gilt lettering to spine and upper board.. First Edition, First Printing. hardcover. Very Good/No Dust Jacket. Ex-Library.
Item Price
£37.57
£9.50 shipping to USA